学科分类
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7 个结果
  • 简介:Ahigher-orderboundaryelementmethod(HOBEM)forsimulatingthefullynonlinearregularwavepropagationanddiffractionaroundafixedverticalcircularcylinderisinvestigated.Thedomaindecompositionmethodwithcontinuityconditionsenforcedontheinterfacesbetweentheadjacentsub-domainsisimplementedforreducingthecomputationalcost.Byadjustingthealgorithmofiterativeprocedureontheinterfaces,fourtypesofcouplingstrategiesareestablished,thatis,Dirchlet/Dirchlet-Neumman/Neumman(D/D-N/N),Dirchlet-Neumman(D-N),Neumman-Dirchlet(N-D)andMixedDirchlet-Neumman/Neumman-Dirchlet(MixedD-N/N-D).Numericalsimulationsindicatethatthedomaindecompositionmethodscanprovideaccurateresultscomparedwiththatofthesingledomainmethod.Accordingtothecomparisonsofcomputationalefficiency,theD/D-N/Ncouplingstrategyisrecommendedforthewavepropagationproblem.Asforthewave-bodyinteractionproblem,theMixedD-N/N-Dcouplingstrategycanobtainthehighestcomputationalefficiency.

  • 标签: fully nonlinear boundary element METHOD domain
  • 简介:Micro-electrondiffraction(MicroED)isanemergingtechniquetousecryo-electronmicroscopetostudythecrystalstructuresofmacromoleculefromitsmicro-/nano-crystals,whicharenotsuitableforconventionalX-raycrystallography.However,thistechniquehasbeenpreventedforitswideapplicationbythelimitedavailabilityofproducinggoodmicro-/nano-crystalsandtheinappropriatetransferofcrystals.Here,wedevelopedacompleteworkflowtopreparesuitablecrystalsefficientlyforMicroEDexperiment.Thisworkflowincludesinsituon-gridcrystallization,single-sideblotting,cryo-focusionbeam(cryo-FIB)fabrication,andcryo-electrondiffractionofcrystalcryo-lamella.ThisworkflowenablesustoapplyMicroEDtostudymanysmallmacromolecularcrystalswiththesizeof2-10μm,whichistoolargeforMicroEDbutquitesmallforconventionalX-raycrystallography.Wehaveappliedthismethodtosolve2.5Acrystalstructureoflysozymefromitsmicro-crystalwithinthesizeof10×10×10μm^3.OurworkwillgreatlyexpandtheavailabilityspaceofcrystalssuitableforMicroEDandfillupthegapbetweenMicroEDandX-raycrystallography.

  • 标签: Cryo-electron MICROSCOPY Cryo FOCUSED ion beam