简介:用单辊甩带法制备了不含高生物毒性元素的Ti60Zr10Ta15Si15非晶薄带,并在高于其晶化开始温度的不同温度下对该非晶薄带进行了真空退火,研究了该非晶薄带在磷酸盐缓冲溶液(PBS)中的电化学腐蚀行为及热处理对其显微组织及其电化学行为的影响。结果表明,用单辊甩带法制备的Ti60Zr10Ta15Si15金属薄带为完全的非晶态结构,其玻璃转变温度和晶化开始温度分别为759K和833K,经过878K真空热处理后,薄带发生了部分晶化,在非晶的基底上析出了Ti相;经过938K热处理后,薄带发生了完全晶化,晶化相主要由Ti、Si3Ta5和SiZr以及TiSi组成。动电位极化测试表明,该非晶合金在PBS溶液中可表现出较为优异的耐蚀性能,部分晶化可进一步提高该合金的耐蚀性能,而完全晶化的合金抗腐蚀性能明显下降。
简介:Thedependenceofperpendicularmagneticanisotropy(PMA)onthebarrierlayerMgOthicknessinMgO/CoFeB/Tamultilayersisinvestigated.TheresultsshowthatthestrongestPMAoccursinasmallwindowofabout2-4nmwiththeincreaseofMgOthicknessfroml-10nm.ThecrystallinedegreeofMgOandthechangeofinteratomicdistancealongtheout-of-planedirectionmaybethemainreasonsforthechangeofPMAinthesemultilayers.Moreover,theroughnessesof2-and4-nm-thickMgOsamplesare3.163and1.8nm,respectively,andboththesamplesshowPMA.TheseresultscouldbeusedtotunethemagneticcharacteristicoftheultrathinCoFeBfilmforfutureapplicationsinperpendicularmagneticdevices.
简介:Two-dimensionalatomic-layeredmaterialisarecentresearchfocus,andsinglelayerTa2O5usedasgatedielectricinfield-effecttransistorsisobtainedviaassembliesofTa2O5nanosheets.However,theelectricalperformanceisseriouslyaffectedbyelectronicdefectsexistinginTa2O5.Therefore,spectroscopicellipsometryisusedtocalculatethetransitionenergiesandcorrespondingprobabilitiesfortwodifferentchargedoxygenvacancies,whoseexistenceisrevealedbyx-rayphotoelectronspectroscopyanalysis.SpectroscopicellipsometryfittingalsocalculatesthethicknessofsinglelayerTa2O5,exhibitinggoodagreementwithatomicforcemicroscopymeasurement.NondestructiveandnoncontactspectroscopicellipsometryisappropriatefordetectingtheelectricaldefectslevelofsinglelayerTa2O5.
简介:Ta2O5电影被常规电子横梁蒸发方法在熔化硅石底层上扔。由在不同温度退火,非结晶、六角形、斜方晶的阶段的Ta2O5电影被获得并且由X光证实衍射计(XRD)结果。X光检查光电子光谱学(XPS)分析证明所有这些电影的化学作文是stoichiometry。非结晶的Ta2O5电影完成最高的激光,这被发现在355或1064nm的导致的损坏阀值(LIDT)任何一个,由六角形的阶段和最后斜方晶的阶段列在后面。当前者显示出一个一致熔化区域,当后者在至少一个缺点点上被集中时,在355和1064nm的损坏形态学是不同的,它被不同损坏机制导致。在1064nm的LIDT的减少被归因于增加结构的缺点,当时在355nm由于增加的联合效果结构的缺点和减少的乐队差距精力。[从作者抽象]
简介:Asanimportantmulti-functionalmaterialappliedinsurfaceacousticwavedevices,opticalcommunications,laserandoptoelectronicsduetoitsgoodphotoelectricandpiezoelectricproperties,lithiumtantalate(LiTaO3)hasdrawnextensiveinterests[1].NumerousphysicalpropertiesofLiTaO3,suchasacoustical,electronicstructures,opticalpropertiesandeffectivemass,thermodynamicproperties,havebeenreportedinseveralpapers.Pointdefectswillaffecttheelectronicstructurewhichshouldberesponsibleformanyphysicalproperties,especiallyopticalproperties.
简介:Fieldemissionoccurredinsuperconductingradio-frequency(SRF)cavitiesisthemajorobstacleoftheacceleratorsoperatingathighgradient,whichpartlycausedbytheinnersurfacecontamination,suchasthehydrocarbonsandtheabsorbedresidualgas.Theplasmaprocessingcanbeaneffectivemethodtosolvethefieldemissionissues.Thepropertiesoflowtemperatureglowdischarge,whichwasargonplasmawiththechemicallyreactiveoxygen,wereinvestigatedfortheSRFcavitiesusedforCADSproject.