简介：Stimulatedemissiondepletion(STED)microscopyisoneoffar-fieldopticalmicroscopytechniquesthatcanprovidesub-diffractionspatialresolution.ThespatialresolutionoftheSTEDmicroscopyisdeterminedbythespeciallyengineeredbeamprofileofthedepletionbeamanditspower.However,thebeamprofileofthedepletionbeammaybedistortedduetoaberrationsofopticalsystemsandinhomogeneityofaspecimen’sopticalproperties,resultinginacompromisedspatialresolution.Thesituationgetsdeterioratedwhenthicksamplesareimaged.Intheworstcase,theseveredistortionofthedepletionbeamprofilemaycausecompletelossofthesuperresolutioneffectnomatterhowmuchdepletionpowerisappliedtospecimens.Previouslyseveraladaptiveopticsapproacheshavebeenexploredtocompensateaberrationsofsystemsandspecimens.However,itisdifficulttocorrectthecomplicatedhigh-orderopticalaberrationsofspecimens.Inthisreport,wedemonstratethatthecomplicateddistortedwavefrontfromathickphantomsamplecanbemeasuredbyusingthecoherentopticaladaptivetechnique.Thefullcorrectioncaneffectivelymaintainandimprovespatialresolutioninimagingthicksamples.
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