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Analysis on Additional Crosstalk Caused by Oblique Incident Ray on PIN Detector Array

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摘要 ThecrosstalkcausedbyobliqueincidentrayonaPINdetectorarrayisanalyzed.Anintegralexpressionofcrosstalkfactorinrelationtoincidentangleandstructureparametersisdeducedandthecorrectnessofthedeductionistestedandverified.

DOI ldeygngzj3/1995841

作者 CAOJun－kai

机构地区不详

出处《半导体光子学与技术：英文版》 2000年1期

关键词硅光电二极管检测器阵列串扰 PIN CCD

分类 [电子电信][物理电子学]

出版日期 2000年01月11日（中国期刊网平台首次上网日期，不代表论文的发表时间）

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来源期刊

半导体光子学与技术：英文版

半导体光子学与技术：英文版

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硅光电二极管检测器阵列串扰 PIN CCD

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